Skip to content

GATE EC Electronic Devices questions

Practise Electronic Devices questions for GATE EC. Explore official PYQs and original subject-wise quizzes, check answers and view available solutions. Free, no sign-in.

Subject, topic, year and type filter the full library. Match any choice within a filter, and all selected filter categories. Search, source and sort apply to this page.

20 on this page
Official PYQ2015Electronic DevicesNAT · 1 mark
A piece of silicon is doped uniformly with phosphorous with a doping concentration of 1016/cm3.10^{16}/cm^{3}. The expected value of mobility versus doping concentration for silicon assuming full dopant ionization is shown below. The charge of an electron is 1.6×10−19 C.1.6 \times 10^{-19} \:C. The conductivity (in S cm−1)\text{(in S } cm^{-1}) of the silicon sample at …
Official PYQ2015Electronic DevicesNAT · 2 marks
A dc voltage of 10 V10\: V is applied across an nn-type silicon bar having a rectangular cross-section and a length of 1 cm1\:cm as shown in figure. The donor doping concentration NDN_{D} and the mobility of electrons μn\mu_{n} are 1016cm−310^{16} cm^{-3} and 1000 cm2V−1s−1,1000\: cm^{2} V^{-1} s^{-1}, respectively. The average time (in μs)(\text{in}\: \mu s) taken by …
Official PYQ2015Electronic DevicesNAT · 2 marks
In a MOS capacitor with an oxide layer thickness of 10 nm,10\: nm, the maximum depletion layer thickness is 100 nm.100\: nm. The permittivities of the semiconductor and the oxide layer are εs\varepsilon_{s} and εox\varepsilon_{ox} respectively. Assuming εs/εox=3,\varepsilon_{s}/\varepsilon_{ox} = 3, the ratio of the maximum capacitance to the minimum capacitance of …
Official PYQ2015Electronic DevicesMCQ · 2 marks
The energy band diagram and the electron density profile n(x)n(x) in a semiconductor are shown in the figures. Assume that n(x)=1015e(qαxkT) cm−3,n(x) = 10^{15}e^{\left(\dfrac{q\alpha x}{kT}\right)}\:cm^{-3} , with α=0.1 V/cm\alpha = 0.1\:V/cm and xx expressed in cm. Given kTq=0.026  V,Dn=36 cm2s−1,\dfrac{kT}{q} = 0.026\;V,D_{n} = 36\:cm^{2}s^{-1}, and Dμ=kTq.\dfrac{D}{\mu} = \dfrac{kT}{q}. The electron …
Official PYQ2015Electronic DevicesNAT · 2 marks
In the circuit shown, the current II flowing through the 50  Ω50\;\Omega resistor will be zero if the value of capacitor C(in μF)C (\text{in}\: \mu F) is ______.
Official PYQ2015Electronic DevicesMCQ · 2 marks
The electric field profile in the depletion region of a p-n junction in equilibrium is shown in the figure. Which one of the following statements is NOT TRUE?
Official PYQ2015Electronic DevicesNAT · 2 marks
A coaxial capacitor of inner radius 1 mm1\: mm and outer radius 5 mm5\: mm has a capacitance per unit length of 172 pF/m.172\: pF/m. If the ratio of outer radius to inner radius is doubled, the capacitance per unit length (in pF/m)\text{(in}\: pF/m) is ________.
Official PYQ2014Electronic DevicesNAT · 1 mark
When the optical power incident on a photodiode is 10 μW10\:\mu W and the responsivity is 0.8 A/W,0.8\: A/ W, the photocurrent generated (in μA)(\text{in} \:\mu A) is_______.
Official PYQ2014Electronic DevicesMCQ · 1 mark
In the figure, assume that the forward voltage drops of the PNPN diode D1D_{1} and Schottky diode D2D_{2} are 0.7 V0.7\: V and 0.3 V,0.3\: V, respectively. If ON denotes conducting state of the diode and OFF denotes non-conducting state of the diode, then in the circuit,
Official PYQ2014Electronic DevicesNAT · 2 marks
In the circuit shown in the figure, the value of capacitor C (in mF)C\:(\text{in}\: mF) needed to have critically damped response i(t)i(t) is ____.
Official PYQ2014Electronic DevicesMCQ · 2 marks
The doping concentrations on the pp-side and nn-side of a silicon diode are 1×1016 cm−31\times 10^{16}\:cm^{-3} and 1×1017 cm−3,1\times 10^{17}\:cm^{-3}, respectively. A forward bias of 0.3 V0.3\:V is applied to the diode. At T=300 K,T = 300\:K, the intrinsic carrier concentration of silicon ni=1.5×1010 cm−3n_{i} = 1.5\times 10^{10}\:cm^{-3} and kTq=26 mV.\dfrac{kT}{q} = 26\:mV. The …
Official PYQ2014Electronic DevicesNAT · 1 mark
In the figure shown, the ideal switch has been open for a long time. If it is closed at t = 0, then the magnitude of the current (in mA) through the 4kΩ4k \Omega resistor at t=0+t= 0^{+} is ________.
Official PYQ2014Electronic DevicesMCQ · 1 mark
A silicon bar is doped with donor impurities ND=2.25×1015atoms/cm3N_{D}= 2.25 \times 10^{15} \text{atoms} / cm^{3}. Given the intrinsic carrier concentration of silicon at T=300 KT = 300 \: K is ni=1.5×1010cm−3.n_{i}= 1.5 \times 10^{10} cm^{-3}. Assuming complete impurity ionization, the equilibrium electron and hole concentrations are
Official PYQ2014Electronic DevicesMCQ · 1 mark
In CMOS technology, shallow P-well or N-well regions can be formed using
Official PYQ2014Electronic DevicesMCQ · 2 marks
In the figure shown, the capacitor is initially uncharged. Which one of the following expressions describes the current I(t)I(t) (in mA) for t>0t > 0?
Official PYQ2014Electronic DevicesNAT · 2 marks
Assume electronic charge q=1.6×10−19 Cq= 1.6 \times 10^{-19} \: C, kT/q=25 mVkT/q=25 \: mV and electron mobility μn=1000cm2/V−s\mu_{n}= 1000cm^{2}/ V-s. If the concentration gradient of electrons injected into a PP-type silicon sample is 1×1021/cm41 \times 10^{21}/cm^{4}, the magnitude of electron diffusion current density (in A/cm2A/cm^{2}) is _________ .
Official PYQ2014Electronic DevicesNAT · 2 marks
Consider an abrupt PN junction (at T=300KT = 300 K) shown in the figure. The depletion region width XnX_{n} on the NN-side of the junction is 0.2μm0.2 \mu m and the permittivity of silicon (εgi)( \varepsilon _{gi} ) is 1.044×10−12 F/cm1.044 \times 10^{-12} \: F/cm. At the junction, the approximate value of the peak electric field (in kV/cmkV/cm) is ___________.
Official PYQ2014Electronic DevicesMCQ · 2 marks
When a silicon diode having a doping concentration of NA=9×1016cm−3N_{A}= 9\times 10^{16}cm^{-3} on pp-side and ND=1×1016cm−3N_{D}= 1 \times 10^{16}cm^{-3} on nn-side is reverse biased, the total depletion width is found to be 3μ3 \mu. Given that the permittivity of silicon is 1.04×10−121.04 \times 10^{-12} F/cm, the depletion width on the p-side and the maximum electric …
Official PYQ2014Electronic DevicesMCQ · 2 marks
For the n-channel MOS transistor shown in the figure, the threshold voltage VThV_{Th} is 0.80.8 V. Neglect channel length modulation effects. When the drain voltage VD=1.6V,V_{D}= 1.6 V, the drain current IDI_{D} was found to be 0.50.5 mA. If VDV_{D}is adjusted to be 22 V by changing the values of R and VDDV_{DD}, the new value of IDI_{D} (in mA) is
Official PYQ2014Electronic DevicesMCQ · 1 mark
A series RCRC circuit is connected to a DCDC voltage source at time t=0t= 0. The relation between the source voltage Vs,V_{s}, the resistance RR, the capacitance CC, and the current i(t)i(t) is given below. Vs=R i(t)+1c∫oti(u)duV_{s}= R \: i(t)+\frac{1}{c}\int ^{t}_{o}i(u)du. Which one of the following represents the current i(t)i(t)?