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GATE EC Electronic Devices questions

Practise Electronic Devices questions for GATE EC. Explore official PYQs and original subject-wise quizzes, check answers and view available solutions. Free, no sign-in.

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17 on this page
Official PYQ2001Electronic DevicesMCQ · 1 mark
In the figure, the LED\text{LED}
Official PYQ1998Electronic DevicesMCQ · 1 mark
The units of qkT\frac{q}{k T} are
Official PYQ1998Electronic DevicesMCQ · 1 mark
A long specimen of pp-type semiconductor material
Official PYQ1998Electronic DevicesMCQ · 1 mark
The electron and hole concentrations in a intrinsic semiconductor are nin_i and pip_i respectively. When doped with a pp-type material, these change to nn and pp, respectively. Then
Official PYQ1997Electronic DevicesMCQ · 1 mark
For a MOS\text{MOS} capacitor fabricated on a pp-type semiconductor, strong inversion occurs when
Official PYQ1997Electronic DevicesMCQ · 1 mark
The intrinsic carrier density at 300 K300 \mathrm{~K} is 1.5×10101.5 \times 10^{10} / cm3\mathrm{cm}^{3}, in silicon. For nn-type silicon doped to 2.25×2.25 \times 101510^{15} atoms /cm3/ \mathrm{cm}^{3}, the equilibrium electron and hole densities are
Official PYQ1996Electronic DevicesMCQ · 1 mark
The pp – type substrate in a conventional pnp n – junction isolated integrated circuit should be connected to
Official PYQ1995Electronic DevicesMCQ · 1 mark
Copper behaves as a
Official PYQ1995Electronic DevicesMCQ · 1 mark
The depletion capacitance, CJ\mathrm{C}_{\mathrm{J}}, of an abrupt P−N\mathrm{P}-\mathrm{N} junction with constant doping on either side varies with reverse bias, VR′V_{R^{\prime}} as
Official PYQ1995Electronic DevicesMCQ · 1 mark
In a P\text{P} type silicon sample, the hole concentration is 2.25×1015/cm32.25 \times 10^{15} / \mathrm{cm}^{3}. If the intrinsic carrier concentration is 1.5×1010/cm31.5 \times 10^{10} / \mathrm{cm}^{3}, the electron concentration is
Official PYQ1995Electronic DevicesMCQ · 1 mark
The diffusion potential across a P-N\text{P-N} junction
Official PYQ1995Electronic DevicesMCQ · 1 mark
The drift velocity of electrons, in silicon
Official PYQ1995Electronic DevicesMCQ · 1 mark
The probability that an electron in a metal occupies the Fermi-level at any temperature (>0 K)(>0 \mathrm{~K})
Official PYQ1994Electronic DevicesMCQ · 1 mark
A small concentration of minority carries is injected into a homogeneous semiconductor crystal at one point. An electric field of 10 V.cm10 \mathrm{~V} . \mathrm{cm} is applied across the crystal and this moves the minority carriers a distance of 1 cm1 \mathrm{~cm} is 20  μ  sec20 \; \mu \; \mathrm{sec}. The mobility (in cm2/\mathrm{cm}^{2} / volt. sec) will be
Official PYQ1993Electronic DevicesMSQ · 1 mark
The built-in potential (Diffusion Potential) in a p−np-n junction
Official PYQ1992Electronic DevicesMCQ · 1 mark
An infrared LED\text{LED} is usually fabricated from
Official PYQ1992Electronic DevicesMCQ · 1 mark
A semiconductor is irradiated with light such that carriers are uniformly generated throughout its volume. The semiconductor is nn-type with ND=1019N_{D}=10^{19} per cm3\mathrm{cm}^{3}. If the excess electron concentration in the steady state is Δn=1015\Delta n=10^{15} per cm3\mathrm{cm}^{3} and if τp=10μsec⁡\tau_{p}=10 \mu \sec [minority carrier life time] the …