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Official PYQ · 2015

GATE EC 2015 Set 1 Q35 — Electronic Devices

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For a silicon diode with long P and N regions, the accepter and donor impurity concentrations are 1×1017 cm−31 \times 10^{17} \:cm^{-3} and 1×1015 cm−31 \times 10^{15} \: cm^{-3}, respectively. The lifetimes of electrons in P region and holes in N region are both 100 μs100 \: \mu s. The electron and hole diffusion coefficients are 49 cm2/s49 \: cm^2/s and 36 cm2/s36 \: cm^2/s, respectively. Assume kT/q=26 mVkT/q=26 \: mV, the intrinsic carrier concentration is 1×1010 cm−31 \times 10^{10} \: cm^{-3}, and q=1.6×10−19 Cq=1.6 \times 10^{-19} \: C. When a forward voltage of 208208 mV is applied across the diode, the hole current density (in nA/cm2nA/cm^2) injected from P region to N region is __________.
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Answer: 28:30

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